Henry Ford's Lean Enterprise System
Statistical process control for nonnormal
distributions
|
|
Specialities
and Unique Capabilities
Henry Ford's Lean Enterprise System
A tongue-in-cheek way of phrasing
this unique
capability might be, "There is no lean enterprise god but Henry Ford,
and
I am His Prophet." (Henry Ford was indeed God in
Aldous Huxley's Brave
New World but this is another matter entirely.)
- "There is no lean enterprise god but Henry
Ford."
- Henry Ford's industries (his automotive plants plus the
industries that
grew to support them) were directly responsible for making the United
States
the wealthiest and most powerful nation on earth.
- "What has Six
Sigma done
for Motorola lately?" (This is not sour grapes, I have an ASQ Six Sigma
Black Belt certification.) In contrast, Ford's system did not let
him
down during the post-World War I depression. It even held up pretty
well during the Great Depression.
- Taiichi Ohno, the developer of the Toyota production
system, says openly
that his ideas came from Henry Ford (with American supermarkets, in
which
products are replaced as they are purchased, as the inspiration for
kanban).
Waste (muda) reduction was a centerpiece of Ford's methods.
- Ford's business system included every element of what we
now know as lean
enterprise, except for the statistical quality control methods that
support
it. (Their introduction began during the 1920s, with Walter Shewhart as
the pioneer of control charting.)
- Continuous improvement (kaizen), in combination with
standardization (making
the new "one best way" the standard for the job) and best practice
deployment
(applying the improvement to every similar operation in the business)
was
a paramount aspect of everything that Ford did.
- The ability to identify waste (muda) that most people
would overlook was
among Ford's most important success secrets.
- Ford's processes included error-proofing (poka-yoke),
and self-check systems
such as those later described by Shigeo Shingo.
- Ford described design for manufacture (DFM) explicitly.
- Ford used the elements of 5S-CANDO, especially
continuous cleaning and
preventive maintenance.
- Supply chain management,
including freight managment
systems (FMSs) and supplier development, played major roles in Ford's
operations.
Just-in-time delivery was a specific goal because Ford realized that
even
materials in transit constituted inventory. The FMS could track a
railroad
car to within one hour, even without the aid of modern information
systems.
- Ford also included the "soft sciences" that are a
prerequisite for the
successful implementation of lean manufacturing. Ford described the key
elements of Dr. Stephen Covey's excellent Principle-Centered
Leadership
very explicitly.
- The entire workforce was apparently trained and
empowered in lean manufacturing,
as shown by numerous worker initiatives to suppress waste. The attitude
at the River Rouge plant regarding waste was, "It worried the men."
This
little phrase shows that lean thinking was for everyone, not only
technical
support personnel.
- "I am His Prophet."
- Levinson, 2002, Henry Ford's Lean Vision:
Enduring Principles
from the First Ford Motor Plant (Productivity Press), is apparently
the first comprehensive reconstruction of the Ford lean enterprise
system.
Searches in Amazon.com and Abebooks.com (The Advanced Book Exchange, a
network of used book dealers) do not unearth any similar references.
Both
sources were used to purchase the references that went into Henry
Ford's
Lean Vision!
- This book is actually a comprehensive survey of every
available book about
the Ford production system. Most of them are, incidentally, out of
print.
- Arnold and Faurote's Ford Methods and the Ford Shops
(1915)
- The notorious Harry Bennett's Ford: We Never Called
Him Henry (1951)
shows how Ford recognized the waste in a rust-flecked pile of slag near
the Detroit, Toledo, & Ironton Railroad.
- Henry Ford's own My Life and Work (1922), Today
and Tomorrow
(1926), and Moving Forward (1930)
- Benjamin Franklin, whose writings influenced Ford,
described some elemental
principles of lean manufacturing: (1) lost time is lost forever (a
cardinal
principle of Goldratt's theory of constraints) and (2) buying inventory
simply to get a good price is a bad idea.
- Edwin Norwood's Ford: Men and Methods (1931),
the story of the River
Rouge plant. It underscored the fact that waste reduction was part of
the
company culture, and it also showed that Ford was using lockout-tagout
for safety during maintenance.
- Charles Sorensen's My Forty Years with Ford
(1956). Sorensen, the
designer of the Willow Run bomber factory, was Ford's production chief.
- Frederick Winslow Taylor's The Principles of
Scientific Management
(1911) and his less-well-known Shop Management. (1911). A table
of metalworking activities in Shop Management clearly
separates
non-value-adding setup from value-adding machining-- and Shigeo Shingo
was influenced by Taylor's writings.
- When compared with modern sources with which I am also
familiar, the
Ford system came together as a complete picture. It is this
complete
picture that I can offer to clients, in the form of a system of
synergistic
and mutually supporting elements.
Nonnormal
Processes (processes
that don't produce bell curve-shaped
distributions)
See my page
on this subject for more information. Few if any SPC textbooks show
what to do when the data don't follow a normal distribution.
Furthermore,
the central limit theorem (which says that the averages of large
samples
follow a normal distribution no matter what the underlying distribution
looks like) works for SPC only if large samples are indeed available. Furthermore,
it doesn't help at all for process capability, which measures the
process'
ability to meet specifications. Specialties include:
- SPC and process capability indices for nonnormal
distributions, such as
the gamma and Weibull distributions
- A one-sided specification is evidence that your process
may be nonnormal.
- Impurity levels often follow the gamma distribution.
- I've seen plenty of statistical quality reports in
which nonnormal data
was plugged into conventional SPC software, which assumes a normal
distribution.
Many points are outside the control limit, simply because the control
limit
is wrong. On the other hand, the process capability (Cp, Cpk) estimates
from such data are almost always overoptimistic. The distribution's
long
tail usually extends toward the specification limit, so the estimate of
the nonconforming fraction (e.g. ~1 ppb for six standard deviations
between
the nominal and the spec limit) can be off by several orders of
magnitude!
- SPC and process capability indices for processes with
nested levels of
variation
- This is typical of batch processes, because there is
within-batch and between-batch
variation. Another strong argument for single-unit processing (where
feasible)!
- Confidence limits for capability indices
- Process capability indices that are based on small
samples have very wide
confidence limits. The confidence interval is fairly wide even when 30
to 100 measurements are available.
- If your customers are asking for monthly Cpk reports
whose basis is a few
measurements, I can educate them.
Some related publications
Levinson, W. A. "Statistical
Process
Control in Microelectronics
Manufacturing," Semiconductor International, November 1994.
Levinson, W.A. "Exact Confidence Limits
for
Process Capabilities" Quality
Engineering, 9(3), 521-528, 1997 (March)
Levinson, W. "Watch Out for Nonnormal
Distributions of Impurities," Chemical
Engineering Progress, May 1997, pp. 70-76.
Levinson, W. "Approximate Confidence
Limits
for Cpk and Confidence
Limits for Non-Normal Process Capabilities," in Quality Engineering,
9(4), 635-640 (1997)
Levinson, William A. "Using SPC in
Batch
Processes." Quality
Digest, March 1998, 45-48
Levinson, William and Polny, Angela.
"SPC
for Tool Particle
Counts," Semiconductor International, June 1999.
Levinson, "SPC for Real-World
Processes:
What to do when
the Normality Assumption Doesn't Work." Presented at the ASQ's Annual
Quality
Conference (2000)
Levinson, W.A., Stensney, Frank, Webb,
Raymond, and Glahn,
Ronald. 2001. "SPC for Particle Counts," Semiconductor International,
10/01
|